Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS-Reference-Cited by-同舟云学术

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Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS

Published:2020-01-24 Issue:7 Volume:52 Page:413-421
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Gnacadja Eustache¹^ORCID,Pauly Nicolas¹^ORCID,Tougaard Sven²^ORCID

Affiliation:

1. Service de Métrologie NucléaireUniversité libre de Bruxelles (CP 165/84) Brussels Belgium

2. Department of Physics, Chemistry and PharmacyUniversity of Southern Denmark Odense Denmark

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6749

Reference29 articles.

1. Photoelectron Spectroscopy

2. High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold

3. On analyzing the intrinsic processes through the Shirley background correction procedure

4. Many-body processes in x-ray photoemission line shapes from Li, Na, Mg, and Al metals

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Intensity-energy response function of Al/Cr-Kα x-ray photoemission instruments: An inter-laboratory study;Journal of Electron Spectroscopy and Related Phenomena;2024-09

2. XPS quantification with universal inelastic electron scattering cross section including intrinsic excitations;Surface and Interface Analysis;2022-08-10

3. Determination of the intensity/energy response function of a hemispherical photoelectron analyser based on Tougaard background;Journal of Electron Spectroscopy and Related Phenomena;2022-07

4. QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole;Surface and Interface Analysis;2022-04-19

5. Corrigenda: Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS;Surface and Interface Analysis;2020-06-23

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