XPS quantification with universal inelastic electron scattering cross section including intrinsic excitations-Reference-Cited by-同舟云学术

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XPS quantification with universal inelastic electron scattering cross section including intrinsic excitations

Published:2022-08-10 Issue:12 Volume:54 Page:1186-1191
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surface & Interface Analysis

Author:

Gnacadja E.¹^ORCID,Pauly N.¹^ORCID,Kang H. J.²,Tougaard S.³^ORCID

Affiliation:

1. Université libre de Bruxelles, Service de Métrologie Nucléaire (CP 165/84) 50 av. F. D. Roosevelt Brussels B‐1050 Belgium

2. Department of Physics Chungbuk National University Cheongju 28644 South Korea

3. Department of Physics, Chemistry and Pharmacy University of Southern Denmark Odense M DK‐5230 Denmark

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7142

Reference36 articles.

1. Many-body processes in x-ray photoemission line shapes from Li, Na, Mg, and Al metals

2. Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

3. Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Intensity-energy response function of Al/Cr-Kα x-ray photoemission instruments: An inter-laboratory study;Journal of Electron Spectroscopy and Related Phenomena;2024-09

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