Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources-Reference-Cited by-同舟云学术

Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources

Author:

Siol Sebastian¹^ORCID,Mann Jennifer²,Newman John²,Miyayama Takuya³,Watanabe Katsumi³,Schmutz Patrik¹,Cancellieri Claudia¹,Jeurgens Lars P.H.¹^ORCID

Affiliation:

1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Joining Technologies and Corrosion Dübendorf Switzerland

2. Physical Electronics Analytical Laboratory, Chanhassen MN USA

3. Ulvac‐PHI Analytical Laboratory, Chigasaki Japan

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference43 articles.

2. Precision method for obtaining absolute values of atomic binding energies;Nordling C;Phys Ther Rev,1957

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