Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging-Reference-Cited by-同舟云学术

Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging

Published:2019-01-20 Issue:5 Volume:6 Page:1801752
ISSN:2198-3844
Container-title:Advanced Science
language:en
Short-container-title:Adv. Sci.

Author:

Masters Robert C.¹^ORCID,Stehling Nicola¹,Abrams Kerry J.¹,Kumar Vikas¹,Azzolini Martina²³,Pugno Nicola M.³⁴⁵,Dapor Maurizio²,Huber Andreas⁶,Schäfer Philip⁶,Lidzey David G.⁷,Rodenburg Cornelia¹

Affiliation:

1. Department of Materials Science and Engineering; University of Sheffield; Sheffield S1 3JD UK

2. European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT*-FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA-INFN); Trento 38123 Italy

3. Laboratory of Bio-Inspired and Graphene Nanomechanics; Department of Civil; Environmental and Mechanical Engineering; University of Trento; Trento 38123 Italy

4. Ket-Lab; Edoardo Amaldi Foundation; Rome 00133 Italy

5. School of Engineering and Materials Science; Queen Mary University of London; London E1 4NS UK

6. Neaspec GmbH; Bunsenstrasse 5 82152 Planegg Germany

7. Department of Physics and Astronomy; University of Sheffield; Sheffield S3 7RH UK

Funder

Engineering and Physical Sciences Research Council

Leverhulme Trust

H2020 European Research Council

H2020 Future and Emerging Technologies

Ministero dell’Istruzione, dell’Università e della Ricerca

Publisher

Wiley

Subject

General Physics and Astronomy,General Engineering,Biochemistry, Genetics and Molecular Biology (miscellaneous),General Materials Science,General Chemical Engineering,Medicine (miscellaneous)

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/advs.201801752/fullpdf

Reference37 articles.

1. New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope

2. Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging

3. Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy

4. Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy

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