Defect profiles in semiconductor structures-Reference-Cited by-同舟云学术

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Defect profiles in semiconductor structures

Published:2007-09 Issue:10 Volume:4 Page:3620-3626
ISSN:1862-6351
Container-title:physica status solidi (c)
language:en
Short-container-title:Phys. Status Solidi (c)

Author:

Coleman P. G.

Publisher

Wiley

Subject

Condensed Matter Physics

Reference31 articles.

1. R. Krause-Rehberg and H. S. Leipner, Positron Annihilation in Semiconductors (Springer, Berlin, 1999).

2. P. G. Coleman (Ed.), Positron Beams and their Applications (World Scientific, Singapore, 2000).

3. Survey of elemental specificity in positron annihilation peak shapes

4. Self ion irradiated Si probed with enhanced depth resolution positron annihilation spectroscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Group III Nitrides;Springer Handbook of Electronic and Photonic Materials;2017

2. Characterization of Thin Films and Coatings;Handbook of Deposition Technologies for Films and Coatings;2010

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