Micro‐inductance method to measure the permeability of magnetic thin films – limits of validity
Author:
Affiliation:
1. Laboratoire DIOM – Université Jean Monnet, 23 rue Paul Michelon, 42023 Saint‐Etienne Cedex 2, France
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.200405530
Reference10 articles.
1. Magnetic properties of multilayered Fe‐Si films
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5. A new swept-frequency permeameter for measuring the complex permeability of thin magnetic films
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1. New technique to measure low-frequency permeability of thin magnetic films surrounded by a current sheet in a multilayer environment;Indian Journal of Physics;2013-05-09
2. Determination of Initial Magnetic Permeability of YIG Thin Films Using the Current Sheet Method;Advanced Materials Research;2011-08
3. Improvement of the multilayer morphology (alumina/Cu/YIG/Cu) to characterize YIG thin film;physica status solidi (a);2011-03-17
4. Original Design for a Micro-Inductance Prototype Characterized Using a New Technique of Inductive Measure;Sensor Letters;2007-03-01
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