Improvement of the multilayer morphology (alumina/Cu/YIG/Cu) to characterize YIG thin film-Reference-Cited by-同舟云学术

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Improvement of the multilayer morphology (alumina/Cu/YIG/Cu) to characterize YIG thin film

Published:2011-03-17 Issue:7 Volume:208 Page:1678-1682
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Khalil Ismaïl,Siblini Ali,Chatelon Jean Pierre,Blanc-Mignon Marie Françoise,Rousseau Jean Jacques

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Characteristics of film type inductors using a FeZrBAg magnetic material

2. Soft magnetic applications in the RF range

3. Simulation of the contribution of magnetic films on planar inductors characteristics

4. An improved microchip thin film transformer formed by vacuum evaporation and sputtering

5. Application of YIG film to thin film inductors

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fabrication and characterization of a planar interleaved micro-transformer with magnetic core;Microelectronics Journal;2014-07

2. Frequency characterization of thin soft magnetic material layers used in spiral inductors;Journal of Magnetism and Magnetic Materials;2012-07

3. Determination of Initial Magnetic Permeability of YIG Thin Films Using the Current Sheet Method;Advanced Materials Research;2011-08

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