Author:
Mica I.,Polignano M. L.,Moreau O.,Codegoni D.,Prestini P. F.,Magni P.
Reference6 articles.
1. Anomalous junction leakage current induced by STI dislocations and its impact on dynamic random access memory devices
2. et al., Proceedings of the IEEE Symposium on VLSI Technology Digest of Technical Papers, Honolulu, Hawaii, 9-11 June 1998, pp. 212-213.
3. et al., Proceedings of the 17th IEEE/SEMI ASMC, Boston, MA, USA, 22-24 May 2006.
4. Electrical fingerprint of pipeline defects
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