Improved pre-characterization method for the random walk based capacitance extraction of multi-dielectric VLSI interconnects

Author:

Zhang Bolong1,Yu Wenjian1,Zhang Chao1

Affiliation:

1. Department of Computer Science and Technology; Tsinghua University; Beijing 100084 China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Beijing Municipality

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modelling and Simulation

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Machine Learning Rooted Pre-characterization Method for Floating Random Walk Based Capacitance Extraction of Multi-dielectric VLSI Interconnects;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08

2. Pre-Characterization Techniques for the FRW Based Capacitance Extraction and Simulation;Monte Carlo Methods for Partial Differential Equations With Applications to Electronic Design Automation;2022-09-03

3. Basics of Floating Random Walk Method for Capacitance Extraction of VLSI Interconnects;Monte Carlo Methods for Partial Differential Equations With Applications to Electronic Design Automation;2022-09-03

4. Deep learning driven random walk method for capacitance extraction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022

5. Advancements and Challenges on Parasitic Extraction for Advanced Process Technologies;Proceedings of the 26th Asia and South Pacific Design Automation Conference;2021-01-18

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