A Machine Learning Rooted Pre-characterization Method for Floating Random Walk Based Capacitance Extraction of Multi-dielectric VLSI Interconnects-Reference-Cited by-同舟云学术

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A Machine Learning Rooted Pre-characterization Method for Floating Random Walk Based Capacitance Extraction of Multi-dielectric VLSI Interconnects

Published:2023-05-08 Issue: Volume: Page:
ISSN:
Container-title:2023 International Symposium of Electronics Design Automation (ISEDA)
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Author:

Xu Yipei¹,He Qing¹

Affiliation:

1. School of Electronic and Information Engineering, Tongji University,Shanghai

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10218344/10218369/10218578.pdf?arnumber=10218578

Reference15 articles.

1. Volume Reduction and Fast Generation of the PreCharacterization Data for Floating Random Walk Based Capacitance Extraction;yang;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2021

2. A Parallel Random Walk Solver for the Capacitance Calculation Problem in Touchscreen Design

3. Adam: A Method for Stochastic Optimization;diederik;Computer Science,2014

4. Auto-Keras: Efficient Neural Architecture Search with Network Morphism;jin;A parallel random walk solver for the capacitance calculation problem in touchscreen design,2018

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