Cross-Sectional Scanning Tunneling Microscopy Applied to Complex Oxide Interfaces-Reference-Cited by-同舟云学术

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Cross-Sectional Scanning Tunneling Microscopy Applied to Complex Oxide Interfaces

Published:2013-03-26 Issue:20 Volume:23 Page:2565-2575
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Chien Te Yu,Chakhalian Jak,Freeland John W.,Guisinger Nathan P.

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adfm.201203430/fullpdf

Reference87 articles.

1. Scanning tunneling microscopy studies of Si donors (SiGa) in GaAs

2. Scanning tunneling spectroscopy and Kelvin probe force microscopy investigation of Fermi energy level pinning mechanism on InAs and InGaAs clean surfaces

3. Tunneling spectroscopy of the GaAs(110) surface

4. Scanning tunneling microscopy of InAs/GaSb superlattices: Subbands, interface roughness, and interface asymmetry

5. Atom-selective imaging of the GaAs(110) surface

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1. Bandgap study of quantum dot-sized SiGe alloy nanocrystals prepared in a nonthermal capacitively-coupled plasma by ambient scanning tunneling spectroscopy;Physica B: Condensed Matter;2024-02

2. Surface Termination-Dependent Nanotribological Properties of Single-Crystal MAPbBr3 Surfaces;The Journal of Physical Chemistry C;2019-12-17

3. Surface reconstructions and modified surface states in La1−xCaxMnO3;Physical Review Materials;2018-10-31

4. Polarity compensation mechanisms on the perovskite surface KTaO 3 (001);Science;2018-02-02

5. Nanostructured Oxides: Cross-Sectional Scanning Probe Microscopy for Complex Oxide Interfaces;Advances in Nanomaterials;2017-10-24

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