Essential Effects on the Mobility Extraction Reliability for Organic Transistors

Author:

Xu Yong12,Sun Huabin12,Liu Ao2,Zhu Huihui2,Li Binhong3,Minari Takeo4,Balestra Francis5,Ghibaudo Gerard5,Noh Yong-Young2ORCID

Affiliation:

1. School of Electronic and Optical Engineering; Nanjing University of Posts and Telecommunications; Nanjing Jiangsu 210023 China

2. Department of Energy and Materials Engineering; Dongguk University; 26 Pil-dong, 3-ga Jung-gu Seoul 100-715 Republic of Korea

3. Institute of Microelectronics; Chinese Academy of Sciences; Beijing 100029 China

4. National Institute for Materials Science; WPI-MANA, 1-1 Namiki Tsukuba Ibaraki 305-0044 Japan

5. IMEP-LAHC; Grenoble-INP; MINATEC; 3 Parvis Louis Neel, BP 257 38016 Grenoble France

Funder

Center for Advanced Soft-Electronics

National Research Foundation of Korea

Ministry of Science ICT and Future Planning

Grant-In-Aid for Scientific Research

Ministry of Education, Culture, Sports, Science and Technology

New Energy and Industrial Technology Development Organization

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

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