Interpretation of TOF‐SIMS data based on information entropy of spectra

Author:

Aoyagi Satoka1ORCID,Mizomichi Keisuke1,Kamochi Keisuke1,Miisho Ako2

Affiliation:

1. Department of Materials and Life Science Seikei University Tokyo Japan

2. Kobelco Research Institute, Inc. Kobe Japan

Funder

Japan Society for the Promotion of Science

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference20 articles.

1. SIMS of organics—Advances in 2D and 3D imaging and future outlook

2. Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

3. Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems

4. Multivariate image analysis strategies for ToF-SIMS images with topography

5. Evaluation of time‐of‐flight secondary ion mass spectrometry spectra of peptides by random forest with amino acid labels: results from a Versailles project on advanced materials and standards interlaboratory study;Aoyagi S;Anal Chem,2020

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