Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions-Reference-Cited by-同舟云学术

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

Published:2009-12-03 Issue:1 Volume:82 Page:98-105
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Lee J. L. S.¹,Ninomiya S.¹,Matsuo J.¹,Gilmore I. S.¹,Seah M. P.¹,Shard A. G.¹

Affiliation:

1. National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom, Quantum Science and Engineering Centre, Kyoto University, Uji, Kyoto, 611-0011, Japan, and CREST, Japan Science and Technology Agency (JST), Chiyoda, Tokyo, 102-0075, Japan

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac901045q

Reference50 articles.

1. Why Is SIMS Underused in Chemical and Biological Analysis? Challenges and Opportunities

2. Three-Dimensional Compositional Analysis of Drug Eluting Stent Coatings Using Cluster Secondary Ion Mass Spectrometry

3. The Chemical Composition of Animal Cells and Their Intracellular Compartments Reconstructed from 3D Mass Spectrometry

4. Depth profiling of cells and tissues by using C60+ and SF5+ as sputter ions

5. Polyethylene terephthalate (PET) bulk film analysis using C60+, Au3+, and Au+ primary ion beams

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