Investigation of an iterative matrix method for the inversion of ARXPS data-Reference-Cited by-同舟云学术

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Investigation of an iterative matrix method for the inversion of ARXPS data

Published:2015-12-22 Issue:2 Volume:48 Page:54-63
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Paynter R. W.¹,Peykov D.²

Affiliation:

1. INRS Énergie Matériaux Télécommunications; Varennes Québec J3X 1S2 Canada

2. Department of Materials Science and Engineering; Massachusetts Institute of Technology; Cambridge MA 02139 USA

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference18 articles.

1. Regularization: A stable and accurate method for generating depth profiles from angle-dependent XPS data

2. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

3. An ARXPS primer

4. Numerical Methods for the Solution of Ill-Posed Problems

5. Rank-Deficient and Discrete Ill-Posed Problems

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