A Platform for Complementary Metal‐Oxide‐Semiconductor Compatible Plasmonics: High Plasmonic Quality Titanium Nitride Thin Films on Si (001) with a MgO Interlayer
Author:
Affiliation:
1. Department of Electrical and Computer Engineering Virginia Commonwealth University Richmond VA 23284 USA
2. Materials Science Center University of Wisconsin-Madison Madison WI 53706 USA
Funder
National Science Foundation
Air Force Office of Scientific Research
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/adpr.202000210
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