Digital Logic Testing and Simulation-Reference-Cited by-同舟云学术

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Digital Logic Testing and Simulation

Published:2003-08-15 Issue: Volume: Page:
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Author:

Miczo Alexander

Publisher

John Wiley & Sons, Inc.

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Next Generation Design For Testability, Debug and Reliability Using Formal Techniques;2022 IEEE International Test Conference (ITC);2022-09

2. Enhanced Reliability Using Formal Techniques;Design for Testability, Debug and Reliability;2021

3. Formal Techniques;Design for Testability, Debug and Reliability;2021

4. Integrated Circuits;Design for Testability, Debug and Reliability;2021

5. On Test Generation for Microprocessors for Extended Class of Functional Faults;IFIP Advances in Information and Communication Technology;2020

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