Liquid‐Metal‐Assisted Synthesis of Patterned GaN Thin Films for High‐Performance UV Photodetectors Array

Author:

Du Yuchen1,Yin Shiqi1,Li Ying1,Chen Jiawang2,Shi Dongfeng34,Guo Erjuan5,Zhang Hui1,Wang Zihan1,Qin Qinggang1,Zou Chongwen6,Zhai Tianyou5ORCID,Li Liang12

Affiliation:

1. Information Materials and Intelligent Sensing Laboratory of Anhui Province Institutes of Physical Science and Information Technology Anhui University Hefei 230601 P. R. China

2. Key Laboratory of Materials Physics Anhui Key Laboratory of Nanomaterials and Nanotechnology Institute of Solid State Physics Hefei Institutes of Physical Science Chinese Academy of Sciences Hefei 230031 P. R. China

3. Key Laboratory of Atmospheric Optics Anhui Institute of Optics and Fine Mechanics Hefei Institutes of Physical Science Chinese Academy of Sciences Hefei 230031 P. R. China

4. Advanced Laser Technology Laboratory of Anhui Province Hefei 230037 P. R. China

5. State Key Laboratory of Materials Processing and Die and Mould Technology School of Materials Science and Engineering Huazhong University of Science and Technology (HUST) Wuhan 430074 P. R. China

6. National Synchrotron Radiation Laboratory University of Science & Technology of China Hefei 230029 P. R. China

Abstract

AbstractGaN's outstanding physical characteristics allow for a wide range of applications in numerous industries. Although individual GaN‐based ultraviolet (UV) photodetectors are the subject of in‐depth research in recent decades, the demand for photodetectors array is rising as a result of advances in optoelectronic integration technology. However, as a prerequisite for constructing GaN‐based photodetectors array, large‐area, patterned synthesis of GaN thin films remains a certain challenge. This work presents a facile technique for pattern growing high‐quality GaN thin films for the assembly of an array of high‐performance UV photodetectors. This technique uses UV lithography, which is not only very compatible with common semiconductor manufacturing techniques, but also enables precise patterning modification. A typical detector has impressive photo‐response performance under 365 nm irradiation, with an extremely low dark current of 40 pA, a high Ilight/Idark ratio over 105, a high responsivity of 4.23 AW−1, and a decent specific detectivity of 1.76 × 1012 Jones. Additional optoelectronic studies demonstrate the strong homogeneity and repeatability of the photodetectors array, enabling it to serve as a reliable UV image sensor with enough spatial resolution. These outcomes highlight the proposed patterning technique's enormous potential.

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

General Materials Science,General Chemistry

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