Spectromicroscopy of Nanoscale Materials in the Tender X‐Ray Regime Enabled by a High Efficient Multilayer‐Based Grating Monochromator-Reference-Cited by-全球学者库

Spectromicroscopy of Nanoscale Materials in the Tender X‐Ray Regime Enabled by a High Efficient Multilayer‐Based Grating Monochromator

Published:2022-11-29 Issue:1 Volume:7 Page:2201382
ISSN:2366-9608
Container-title:Small Methods
language:en
Short-container-title:Small Methods

Author:

Werner Stephan¹^ORCID,Guttmann Peter¹,Siewert Frank¹,Sokolov Andrey¹,Mast Matthias¹,Huang Qiushi²,Feng Yufei²,Li Tongzhou²,Senf Friedmar³,Follath Rolf⁴,Liao Zhohngquan⁵,Kutukova Kristina⁵,Zhang Jian⁶,Feng Xinliang⁷,Wang Zhan‐Shan²,Zschech Ehrenfried⁵⁸,Schneider Gerd¹⁹

Affiliation:

1. Helmholtz‐Zentrum Berlin für Materialien und Energie Elektronenspeicherring BESSY II 12489 Berlin Germany

2. Key Laboratory of Advanced Micro‐Structured Materials MOE Institute of Precision Optical Engineering School of Physics Science and Engineering Tongji University Shanghai 200092 P. R. China

3. Institute for Physics and Astronomy Potsdam University 14476 Potsdam Germany

4. Paul Scherrer Institut Villigen 5232 Switzerland

5. Fraunhofer Institute for Ceramic Technologies and Systems 01109 Dresden Germany

6. Northwestern Polytechnical University Xi'an 710129 P. R. China

7. Technical University Dresden Faculty for Chemistry and Food Chemistry 01067 Dresden Germany

8. deepXscan GmbH 01067 Dresden Germany

9. Humboldt‐Universität zu Berlin Institut für Physik 12489 Berlin Germany

Publisher

Wiley

Subject

General Materials Science,General Chemistry

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