Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces

Published:2001 Issue:10 Volume:31 Page:927-937
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Pickering C.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference30 articles.

1. Electromagnet;Pickering,1995

2. Advances in multichannel spectroscopic ellipsometry

3. Ellipsometry and Polarized Light. North-Holland: Amsterdam, 1976.

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