In Situ Characterization of Epitaxy
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Elsevier
Reference101 articles.
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2. In situ measurements of InAs and InP (0 0 1) surface stress changes induced by surface reconstruction transitions;Fuster;Surf Sci,2006
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4. Optical second-harmonic generation for studying surfaces and interfaces;McGilp;J Phys Condens Matter,1989
5. Growth of InP in a Novel Remote-Plasma MOCVD Apparatus;Losurdo;J De Phys IV,2001
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. GaN‐Based Materials;Nitride Semiconductor Technology;2020-08-03
2. In situ stress observation in oxide films and how tensile stress influences oxygen ion conduction;Nature Communications;2016-02-25
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