Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry-Reference-Cited by-同舟云学术

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Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Published:2015-02-24 Issue:4 Volume:57 Page:1006-1013
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Moungache A.¹²,Bayard B.¹,Tahir Abakar Mahamat²,Robert S.¹,Jamon D.¹,Gambou F.¹²

Affiliation:

1. LT2C, EA3523, Université de Saint Etienne, Université de Lyon; 42023 Saint Etienne France

2. Université de N'Djamena; Tchad

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/mop.28998/fullpdf

Reference11 articles.

1. A polynomial approach for reflection, transmission, and ellipsometric parameters by isotropic stratified media;El-Agez;Opt Appl,2010

2. The effect of filler on the temperature coefficient of the relative permittivity of PTFE/ceramic composites;Rajesh;Physica B Condens Matter,2011

3. The effects of filler content and size on the properties of PTFE/SiO2 composites;Chen;J Polym Res,2003

4. PTFE/Sr2Ce2Ti5O16 polymer ceramic composites for electronic packaging applications;Subodh;J Eur Ceram Soc,2007

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