Effect of crystal structure on the background intensity in XRF-Reference-Cited by-同舟云学术

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Effect of crystal structure on the background intensity in XRF

Published:2005 Issue:2 Volume:34 Page:169-171
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Verkhovodov Petro O.

Publisher

Wiley

Subject

Spectroscopy

Reference9 articles.

1. X-Ray Spectrometric Analysis. Separated Corrections for Physical Processes. Naukova Dumka: Kyiv, 1992.

2. Diffraction Effects in X-Ray Fluorescence Analysis of Semiconductor-Grade Silicon and other Monocrystalline Materials

3. Quantitative X-Ray Fluorescence Analysis. Nauka: Moscow, 1969.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Combined multiple-excitation FP method for micro-XRF analysis of difficult samples;Powder Diffraction;2010-06

2. Atomic spectrometry update—X-ray fluorescence spectrometry;J. Anal. At. Spectrom.;2006

3. Atomic spectrometry update. X-Ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2005

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