1. Rubin B., Trace Analysis of Semiconductor Materials, Cali J. P., Ed. (Pergamon Press, Inc., New York, 1964), p. 5.
2. Klug H. P. and Alexander L. E., X-Ray Diffraction Procedures (John Wiley & Sons, Inc., New York, 1954), p. 291 et seq.
3. The X-Ray Spectrographic Analysis of Thin Films by the Milliprobe Technique