Three-dimensional density measurements of ultra low density materials by X-ray scatter using confocal micro X-ray fluorescence spectroscopy
Author:
Affiliation:
1. Materials Science and Technology Division; Los Alamos National Laboratory; Los Alamos; NM; 87545; USA
2. Chemistry Division; Los Alamos National Laboratory; Los Alamos; NM; 87545; USA
Publisher
Wiley
Subject
Spectroscopy
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/xrs.2389/fullpdf
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1. Nondestructive Investigations of a Copper- and Argon-Doped Sputtered Beryllium Capsule Using X-Rays in Three Dimensions
2. Further Characterizations of Sputtered Copper Beryllium Capsules Using Confocal Micro X-Ray Fluorescence
3. Micro X-ray fluorescence in materials characterization
4. Elemental and Molecular Characterization of Aged Polydimethylsiloxane Foams
5. Preparation and characterization of polymer layer systems for validation of 3D Micro X-ray fluorescence spectroscopy
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