Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction-Reference-Cited by-同舟云学术

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Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

Published:2004 Issue:12 Volume:36 Page:1513-1515
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Nakamura H.,Fujihara N.,Nojima M.,Tamura K.,Ishii H.,Owari M.,Oshima C.,Nihei Y.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

1. Photoelectron diffraction studies on the structure of sulfur-passivated InP(100) and CaF2 layers grown on S/InP(100)

2. Photoelectron diffraction study of the surfaces of Si(111)√3×√3–Al and –In with Mo Mζ and Cr Lα lines

3. Development of a Novel Instrument for X-Ray Photoelectron Diffraction and Holography

4. Design of a new high angle-resolving electron energy analyzer

5. Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

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2. X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments;Journal of Electron Spectroscopy and Related Phenomena;2022-05

3. Hexagonal boron nitride monolayers on metal supports: Versatile templates for atoms, molecules and nanostructures;Surface Science Reports;2019-03

4. Surface structural analysis ofh-BN/Ni (111) by X-ray photoelectron diffraction excited by Al Kα and Cr Lα lines;Surface and Interface Analysis;2006

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