Development of a Novel Instrument for X-Ray Photoelectron Diffraction and Holography

Abstract

For X-ray photoelectron diffraction (XPED) and holography measurements we developed a novel laboratory instrument with the multienergy high power X-ray source and the high energy and high angular resolution photoelectron spectrometer system. The photon intensities of Al–Kα, Cr–Lα and Cu–Kα were estimated at 4.6 × 1011 cps, 7.5 × 1010 cps and 7.2 × 1010 cps, respectively. Ag3d XPS also revealed that the energy resolutions of Al–Kα and Cr–Lα sources were 0.9 eV and 3.1 eV, respectively. XPS and XPED of h-BN/Ni(111) excited by Al–Kα and Cr–Lα elucidated the potential and the validity of the XPED and holography analysis by using this novel instrument. Cu–Kα excitation XPS and Ti1s XPED measurements of the SrTiO3 (001) surface have also been performed.