Deformation‐induced stress/strain mapping and performance evaluation of a‐IGZO thin‐film transistors for flexible electronic applications-Reference-Cited by-同舟云学术

Deformation‐induced stress/strain mapping and performance evaluation of a‐IGZO thin‐film transistors for flexible electronic applications

Published:2020-08-21 Issue:2 Volume:29 Page:130-142
ISSN:1071-0922
Container-title:Journal of the Society for Information Display
language:en
Short-container-title:J Soc Inf Display

Author:

Dash Taraprasanna¹^ORCID,Mohapatra Eleena¹^ORCID,Maiti Chinmay K.¹

Affiliation:

1. Department of Electronics and Communication Engineering Siksha 'O' Anusandhan (Deemed to be University) Bhubaneswar 751030 India

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jsid.963

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