Structural Stabilization and Piezoelectric Enhancement in Epitaxial (Ti 1− x Mg x ) 0.25 Al 0.75 N(0001) Layers-Reference-Cited by-同舟云学术

Structural Stabilization and Piezoelectric Enhancement in Epitaxial (Ti 1− x Mg x ) 0.25 Al 0.75 N(0001) Layers

Author:

Wang Baiwei¹,Aryana Kiumars²,Gaskins John T.²,Hopkins Patrick E.²,Khare Sanjay V.³,Gall Daniel¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering Rensselaer Polytechnic Institute Troy NY 12180 USA

2. Department of Mechanical and Aerospace Engineering University of Virginia Charlottesville VA 22904 USA

3. Department of Physics and Astronomy University of Toledo 2801 West Bancroft Street Toledo OH 43606 USA

Funder

National Science Foundation

Office of Naval Research

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

Reference96 articles.

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