Affiliation:
1. School of Microelectronics University of Science and Technology of China Hefei 230026 China
Abstract
AbstractSensitive high‐energy photon detection from UV to X‐ray and high‐resolution array imaging are critical for medical diagnosis, space exploration, and scientific research. The key challenges for high‐performance photodetector and imaging arrays are the effective material and device design strategies for the miniaturization and integration of the device. Here, photon‐controlled diodes (i.e., the detector has rectifying characteristics only under light irradiation) are proposed for high‐resolution and anti‐crosstalk array imaging applications without integrating the switching element. Based on ultra‐wide bandgap semiconductor Ga2O3, the sensitive DUV/X‐ray photon‐controlled diodes are realized by the design of high‐resistance Ga2O3 film and high‐barrier contact. The device exhibits remarkable detection performance, including high photo‐responsivity (168 A W−1) and specific detectivity (1.45 × 1015 Jones) under DUV illumination, as well as a high sensitivity (1.23 × 105 µC Gyair−1 cm−2) under X‐ray light. Moreover, the low dark current and excellent rectification characteristics are obtained. Furthermore, its potential for high‐density and anti‐crosstalk array imaging applications is verified. These results not only bring forth new insights in the implementation of high‐performance DUV/X‐ray photodetector, but also pave a feasible way to realize high pixel density detector array through the simplified fabrication process for high‐resolution imaging applications.
Funder
National Natural Science Foundation of China
National Key Research and Development Program of China
University of Science and Technology of China
Fundamental Research Funds for the Central Universities
China Postdoctoral Science Foundation
Cited by
2 articles.
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