Stability of dislocation structures in copper towards stress relaxation investigated by high angular resolution 3D X-ray diffraction-Reference-Cited by-同舟云学术

Stability of dislocation structures in copper towards stress relaxation investigated by high angular resolution 3D X-ray diffraction

Published:2008-09-22 Issue:1 Volume:206 Page:21-30
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Jakobsen Bo,Poulsen Henning Friis,Lienert Ulrich,Bernier Joel,Gundlach Carsten,Pantleon Wolfgang

Funder

Danish Natural Science Research Council

Danish National Research Foundation

U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.200824257/fullpdf

Reference24 articles.

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3. Creep at intermediate temperatures : An in situ study of the evolution of the cell boundaries in the high voltage electron microscope

4. The determination of density and distribution of dislocations in deformed single crystals from broadened X-ray diffraction profiles

5. M. A. Krivoglaz X-ray and Neutron Diffraction in Nonideal Crystals (Springer Verlag, Berlin, 1996).

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