Creep at intermediate temperatures : An in situ study of the evolution of the cell boundaries in the high voltage electron microscope
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference9 articles.
1. J. Friedel, to appear in Revue de Physique Appliquée.
2. Constitutive Equations in Plasticity;Miekk-Oja,1975
3. Phenomenological and structural analysis of recovery-controlled creep, with special reference to the creep of single-crystal silver chloride
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