Sample rotation improves gas cluster sputter depth profiling of polymers-Reference-Cited by-同舟云学术

Sample rotation improves gas cluster sputter depth profiling of polymers

Author:

Smith Emily F.¹^ORCID,Counsell Jonathan D. P.²,Bailey James³⁴,Sharp James S.³,Alexander Morgan R.⁵,Shard Alexander G.⁶,Scurr David J.⁵

Affiliation:

1. NMRC, School of Chemistry; University of Nottingham; Nottingham NG7 2RD UK

2. Kratos Analytical Ltd, Wharfside; Trafford Wharf Road Manchester M17 1GP UK

3. School of Physics and Astronomy; University of Nottingham; Nottingham NG7 2RD UK

4. School of Physics and Astronomy, E C Stoner Building; University of Leeds; Leeds LS2 9JT UK

5. School of Pharmacy; University of Nottingham; Nottingham NG7 2RD UK

6. National Physical Laboratory; Teddington Middlesex TW11 0LW UK

Funder

Engineering and Physical Sciences Research Council

University of Nottingham-Equipment Account.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference18 articles.

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