Experimental determination of the inelastic mean free path (IMFP) of electrons in selected oxide films applying surface excitation correction-Reference-Cited by-同舟云学术

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Experimental determination of the inelastic mean free path (IMFP) of electrons in selected oxide films applying surface excitation correction

Published:2006 Issue:4 Volume:38 Page:624-627
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Gurban S.,Gergely G.,Toth J.,Varga D.,Jablonski A.,Menyhard M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference26 articles.

1. Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

2. Elastic backscattering of electrons: determination of physical parameters of electron transport processes by elastic peak electron spectroscopy

3. Electron inelastic mean free path measured by elastic peak electron spectroscopy for 24 solids between 50 and 3400 eV

4. Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy

5. Experimental test of model for angular and energy dependence of reflection-electron-energy-loss spectra

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