Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate-Reference-Cited by-同舟云学术

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Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

Published:2004-07 Issue:7 Volume:36 Page:632-639
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Grosvenor A. P.,Kobe B. A.,McIntyre N. S.,Tougaard S.,Lennard W. N.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

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