Temperature-dependent electrical characterization of exfoliatedβ-Ga2O3micro flakes-Reference-Cited by-同舟云学术

Temperature-dependent electrical characterization of exfoliatedβ-Ga2O3micro flakes

Published:2014-02-19 Issue:3 Volume:211 Page:543-549
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Mitdank R.¹,Dusari S.¹,Bülow C.¹,Albrecht M.²,Galazka Z.²,Fischer S. F.¹

Affiliation:

1. AG Neue Materialien; Humboldt-Universität zu Berlin; 10099 Berlin Germany

2. Leibniz Institute for Crystal Growth; Max-Born-Straße 2 12489 Berlin Germany

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Optical Absorption and Photoconductivity in the Band Edge ofβ−Ga2O3

2. Deep-ultraviolet transparent conductive β-Ga2O3 thin films

3. Transparent semiconducting oxides: materials and devices

4. Gallium oxide (Ga2O3) metal-semiconductor field-effect transistors on single-crystal β-Ga2O3 (010) substrates

5. Preparation of highly conductive, deep ultraviolet transparent β-Ga2O3 thin film at low deposition temperatures

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