Si and Ge nanocrystals in resonator multilayer structures-Reference-Cited by-同舟云学术

Si and Ge nanocrystals in resonator multilayer structures

Published:2016-10-07 Issue:11 Volume:213 Page:2867-2872
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Grachev D. A.¹,Ershov A. V.¹,Belolipetsky A. V.²,Krasilnikova L. V.¹³,Yablonskiy A. N.¹³,Andreev B. A.¹³,Gusev O. B.²

Affiliation:

1. Lobachevsky University; Gagarina Prospekt 23 603950 Nizhny Novgorod Russia

2. Ioffe Physical-Technical Institute RAS; Politekhnicheskaya 26 194021 St Petersburg Russia

3. Institute for Physics of Microstructures RAS; Academicheskaya 7 603087 Nizhny Novgorod Russia

Funder

Russian Foundation for Basic Research

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201600383/fullpdf

Reference28 articles.

1. Quantum confinement in Si and Ge nanostructures: Theory and experiment

2. Annealing-induced evolution of the structural and morphological properties of a multilayer nanoperiodic SiO x /ZrO2 system containing Si nanoclusters

3. Formation of Si nanocrystals in multilayered nanoperiodic Al2O3/SiO x /Al2O3/SiO x /.../Si(100) structures: Synchrotron and photoluminescence data

4. Optical properties of a microcavity containing silicon nanocrystals

5. Microcavity enhanced spontaneous emission from silicon nanocrystals

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2. Deep Level Assessment of n-Type Si/SiO2Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots;ECS Journal of Solid State Science and Technology;2018

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