Deep Level Assessment of n-Type Si/SiO2Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots
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Published:2017-08-01
Issue:4
Volume:80
Page:181-190
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Aouassa Mansour,Vrielinck Henk,Simoen Eddy
Publisher
The Electrochemical Society