Thermoelectric properties of Ge/Si heterostructures: A combined theoretical and experimental study-Reference-Cited by-同舟云学术

Thermoelectric properties of Ge/Si heterostructures: A combined theoretical and experimental study

Published:2015-11-30 Issue:3 Volume:213 Page:524-532
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Fiedler Gregor¹,Nausner Lukas²,Hu Yang²,Chen Peixuan²,Rastelli Armando²,Kratzer Peter¹

Affiliation:

1. Faculty of Physics and Center for Nanointegration (CENIDE); University of Duisburg-Essen; 47048 Duisburg Germany

2. Institute of Semiconductor and Solid State Physics; Johannes Kepler University Linz; Altenbergerstrasse 69, 4040 Linz Austria

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201532486/fullpdf

Reference31 articles.

1. Silicon nanostructures for thermoelectric devices: A review of the current state of the art

2. Dynamical behavior and cut-off frequency of Si/SiGe microcoolers

3. A comparison of thin film microrefrigerators based on Si/SiGe superlattice and bulk SiGe

4. Multilayered Ge/SiGe Material in Microfabricated Thermoelectric Modules

5. The cross-plane thermoelectric properties of p-Ge/Si0.5Ge0.5 superlattices

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