The investigation of NbO2and Nb2O5electronic structure by XPS, UPS and first principles methods-Reference-Cited by-同舟云学术

The investigation of NbO2and Nb2O5electronic structure by XPS, UPS and first principles methods

Published:2013-02-28 Issue:8 Volume:45 Page:1206-1210
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Weibin Zhang,Weidong Wu¹,Xueming Wang¹,Xinlu Cheng²,Dawei Yan,Changle Shen¹,Liping Peng¹,Yuying Wang¹,Li Bai¹

Affiliation:

1. Department of Nuclear Engineering and New Energy; The Engineering and Technical College of Chengdu University of Technology; Leshan; 614099; PR China

2. Institute of Atomic and Molecular Physics; Sichuan University; Chengdu; 610064; PR China

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference46 articles.

1. Internal stress and optical properties of Nb_2O_5 thin films deposited by ion-beam sputtering

2. Electrochromic properties of niobium oxide thin films prepared by radio‐frequency magnetron sputtering method

3. Electrochromism at Niobium Pentoxide Electrodes in Aqueous and Acetonitrile Solutions

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