Quantitative Study on the Evolution of Microstructure, Strength, and Electrical Conductivity of the Annealed Oxygen‐Free Copper Wires

Author:

Sun Pengfei12ORCID,Li Zhiwei3,Hou Jiapeng1,Xu Aimin3,Wang Qiang1,Zhang Yi3,Zhang Zhenjun1,Zhang Penglin2,Zhang Zhefeng1

Affiliation:

1. Shi-Changxu Innovation Center for Advanced Materials Institute of Metal Research Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 P. R. China

2. State Key Laboratory of Advanced Processing and Recycling of Nonferrous Metals Lanzhou University of Technology Lanzhou 730050 P. R. China

3. National Quality Supervision and Inspection Center of Electrical Equipment Safety Performance Zhejiang Huadian Equipment Testing Institute Hangzhou 310015 P. R. China

Funder

National Natural Science Foundation of China

State Grid Corporation of China

China Postdoctoral Science Foundation

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

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