Selecting subgrids from a spatial monitoring network: Proposal and application in semiconductor manufactoring process
Author:
Affiliation:
1. University of Milano-Bicocca; Economia, Metodi Quantitativi e Strategia d'impresa; Milan Italy
2. Università Cattolica del Sacro Cuore; Department of Statistical Sciences; Milan Italy
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/qre.2184/fullpdf
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