Improved test structure for on-wafer microwave characterization of components-Reference-Cited by-同舟云学术

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Improved test structure for on-wafer microwave characterization of components

Published:2010-12-15 Issue:2 Volume:53 Page:249-254
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Descamps Philippe,Abessolo-Bidzo Dolphin,Poirier Patrick

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/mop.25738/fullpdf

Reference7 articles.

1. An analysis of microwave de-embedding errors;Glasser;IEEE Trans Microwave Theory Tech,1978

2. A comprehensive millimeter-wave calibration development and verification approach;Okamura;IEEE Microwave Symp Digest,2000

3. M.-H. Chol G.-W. Huangl K.-M. Chen A.-S. Pengl C.-S. Chiul Y.-M. Tengl H.-Y. Chen A novel de-embedding technique for on-wafer microwave characterization 2004 917 920

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz;International Journal of RF and Microwave Computer-Aided Engineering;2012-11-15

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