Investigating the phonon line shapes of TMDs: An analytical approach-Reference-Cited by-同舟云学术

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Investigating the phonon line shapes of TMDs: An analytical approach

Published:2020-07-09 Issue:10 Volume:51 Page:2036-2045
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J Raman Spectrosc

Author:

Zhou Chenzhang¹,Adu Kofi W.²³^ORCID

Affiliation:

1. Department of Engineering Science and Mechanics Pennsylvania State University—University Park State College Pennsylvania USA

2. Department of Physics Pennsylvania State University—Altoona College Altoona Pennsylvania USA

3. Materials Research Institute Pennsylvania State University—University Park State College Pennsylvania USA

Funder

Penn State Multi-Campus Research Experience for Undergraduates

Penn State Altoona-College Office of Research and Sponsored Programs

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.5943

Reference78 articles.

1. Light Scattering in Solids IX

2. Determining the number of layers in few-layer graphene by combining Raman spectroscopy and optical contrast

3. Optical phonons in polar semiconductor nanowires

4. Rigid-layer Raman-active modes inN-layer transition metal dichalcogenides: interlayer force constants and hyperspectral Raman imaging

5. Raman Scattering from Si1-xGex Alloy Nanowires

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4. Broadband infrared study of pressure-tunable Fano resonance and metallization transition in 2H-$$\hbox {MoTe}_2$$;Scientific Reports;2022-10-15

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