L. Reimer, Scanning Electron Microscopy — Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, Volume 45. Editiorial Board: J. M. Enoch, D. L. Macadam, A. L. Schawlow, K. Shimoda and T. Tamir). XVIII + 457 S., 247 Abb., 5 Tab. Berlin-Heidelberg-New York-Tokyo 1985. Springer Verlag. DM 112,00. ISBN: 3-540-13530-8
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Published:1987
Issue:3
Volume:27
Page:166-166
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ISSN:0233-111X
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Container-title:Journal of Basic Microbiology
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language:en
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Short-container-title:J Basic Microbiol
Subject
Applied Microbiology and Biotechnology,General Medicine
Cited by
1 articles.
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