Methodology of Accelerated Aging-Reference-Cited by-同舟云学术

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Methodology of Accelerated Aging

Published:1985-03 Issue:3 Volume:64 Page:717-764
ISSN:8756-2324
Container-title:AT&T Technical Journal
language:en
Short-container-title:

Author:

Joyce W. B.,Liou K-Y.,Nash F. R.,Bossard P. R.,Hartman R. L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering

Cited by 41 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Multi-Component Model for Semiconductor Laser Degradation;Advanced Laser Diode Reliability;2021

4. Bayesian optimum accelerated life test plans based on quantile regression;Communications in Statistics - Simulation and Computation;2019-01-21

5. A literature review on planning and analysis of accelerated testing for reliability assessment;Quality and Reliability Engineering International;2017-07-21

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