Evaluation of microchannel plate gain drops caused by high ion fluxes in time‐of‐flight mass spectrometry: A novel evaluation method using a multi‐turn time‐of‐flight mass spectrometer-Reference-Cited by-同舟云学术

Evaluation of microchannel plate gain drops caused by high ion fluxes in time‐of‐flight mass spectrometry: A novel evaluation method using a multi‐turn time‐of‐flight mass spectrometer

Published:2021-02-08 Issue:3 Volume:56 Page:
ISSN:1076-5174
Container-title:Journal of Mass Spectrometry
language:en
Short-container-title:J Mass Spectrom

Author:

Kobayashi Hiroshi¹²^ORCID,Hondo Toshinobu³⁴^ORCID,Toyoda Michisato¹⁴^ORCID

Affiliation:

1. Department of Physics, Graduate School of Science Osaka University Osaka 560‐0043 Japan

2. Hamamatsu Photonics K.K. Iwata 438‐0193 Japan

3. MS‐Cheminformatics LLC Toin 511‐0231 Japan

4. Project Research Center for Fundamental Sciences, Graduate School of Science Osaka University Osaka 560‐0043 Japan

Funder

Japan Agency for Medical Research and Development

Publisher

Wiley

Subject

Spectroscopy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jms.4706

Reference19 articles.

1. Factors affecting the ultraviolet laser desorption of proteins

2. MALDI induced saturation effects in chevron microchannel plate detectors

3. The effect of microchannel plate gain depression on PAPA photon counting cameras

4. Analysis of microchannel plate response in relation to pulsed laser time‐of‐flight photoemission spectroscopy

5. The operation of microchannel plates at high count rates

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2. Estimation of the Spatial Extent of the Transient Gain Drop in a Microchannel Plate;Mass Spectrometry;2023-11-07

3. Restoration of saturated outputs from microchannel plate photomultiplier tubes in sub-microsecond single-pulse-current mode;Review of Scientific Instruments;2023-11-01

4. Evaluation of transient gain-drop and following recovery property on microchannel plate: Comparison between two evaluation methods;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-08

5. Evaluation of microchannel plate gain drops caused by high ion fluxes in time‐of‐flight mass spectrometry: A novel evaluation method using a multi‐turn time‐of‐flight mass spectrometer;Journal of Mass Spectrometry;2021-02-08