Physics-of-Failure Approach to PHM-Reference-Cited by-同舟云学术

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Physics-of-Failure Approach to PHM

Published:2018-08-24 Issue: Volume: Page:61-84
ISSN:
Container-title:Prognostics and Health Management of Electronics
language:
Short-container-title:

Author:

Cheng Shunfeng¹,Raghavan Nagarajan²,Gu Jie³,Mathew Sony⁴,Pecht Michael G.⁵

Affiliation:

1. Intel Corporation; Hillsboro OR USA

2. Engineering Product Development (EPD) Pillar; Singapore University of Technology and Design (SUTD); Singapore

3. Apple; San Francisco Bay Area CA USA

4. Schlumberger; Denton TX USA

5. University of Maryland; Center for Advanced Life Cycle Engineering; College Park MD USA

Publisher

John Wiley and Sons Ltd

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9781119515326.ch3/fullpdf

Reference55 articles.

1. Gu , J. Pecht , M. 2008 54 th Annual Reliability & Maintainability Symposium, Las Vegas, NV

2. Product architecture assessment: a tool to link product, process, and supply chain design decisions;Fixson;Journal of Operations Management,2005

3. Prognostics implementation methods for electronics;Gu;Proceedings of the Annual Reliability and Maintainability Symposium,2007

4. Bowles , J. 2003 Fundamentals of failure modes and effects analysis. Tutorial Notes of the Annual Reliability and Maintainability Symposium

5. Failure-effect analysis;Coutinho;Transactions of the New York Academy of Sciences,1964

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