Author:
Czekalski T.,Zielińska-Rohozińska E.
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference17 articles.
1. : Semi-insulating III — V Materials Proc. 6th Conf., Toronto, eds A. G. Milnes and C. J. MinerHilger, Bristol 1990
2. , , , : Semi-Insulating III — V Materials, proc. 5th Conf., Malmö, eds and , Hilger, Bristol 1988
3. A line-scan system to assess homogeneity of [EL2] in heat-treated LEC SI GaAs
4. An X-ray monochromator system using successive reflection and its application to measurements of diffraction curves of annealed GaAs wafers
5. A quantitative light scattering tomography technique for measuring microprecipitate concentrations in GaAs and InP