Akashi Seisakusho Ltd - SEM Development 1972-1986

Author:

Hayles Michael F.1

Affiliation:

1. Cryo-FIB/FEG-SEM Technologist; Eindhoven The Netherlands

Publisher

John Wiley & Sons, Ltd

Reference6 articles.

1. Combined light and electron microscope in routine histopathology;Jones;Journal of Clinical Pathology,1982

2. Development of dual stage scanning electron microscope ISI DS-130;Koike;Proceedings of the 37th EMSA,1979

3. Some recent developments in low voltage E-beam testing of ICs;Menzel;Journal of Microscopy,1985

4. A 100 kV transmission electron microscope with single-field condenser-objective;Riecke;Proceedings of the 6th International Congress for Electron Microscopy,1966

5. Objective lens properties of very strong excitation;Suzuki;Proceedings of the 26th EMSA,1968

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